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• Arrow Silicon-SPM Sensors
  Our new Arrow™ sensor is designed for easy tip positioning and high resolution imaging. It fits to all well-known commercial SPMs (Scanning Probe Microscopes). The sensor consists of a holding chip with a cantilever which has a tetrahedral tip at its triangular free end. The probe entirely made of monolithic, highly doped silicon.
  

  Adobe Acrobat Reader Dokument: 514,6 Kb

  Link: www.nanoworld.com/c/c22.html
  
• NANOSENSORS introduces PointProbe Plus AFM probe
  NANOSENSORS replaces the Pointprobe Series with the new PointProbe Plus
  

  Adobe Acrobat Reader Dokument: 239,3 Kb

  Link: www.nanosensors.com/
  
• NanoWorld introduces Hybrid-Nitride Probe
  NanoWorld officially introduced its new Hybrid-Nitride AFM probe for contact-mode.
  

  Adobe Acrobat Reader Dokument: 93,5 Kb

  Link: www.nanoworld.com/c/c23.html
  
• Pointprobe Silicon-SPM-Sensors
  Our Pointprobe®-Sensor is a versatile silicon AFM-Sensor for very high resolution imaging and fits to all well-known commercial SPMs (Scanning Probe Microscopes). It consists of a single crystal silicon cantilever with integrated single crystal silicon tip. The cantilever and the tip are supported by a single crystal silicon holder. True atomic resolution has been achieved by several research facilities in UHV using our NonContact / TappingMode™ sensors NCH and NCL.
  

  Adobe Acrobat Reader Dokument: 1078,2 Kb

  Link: www.nanoworld.com/c/c21.html